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A Study on Analysis of NVP Reliability Using Genetic Algorithms
Shin Kyeong Ae, Han Pan Am The Transactions of the Korea Information Processing Society (1994 ~ 2000),
Vol. 6, No. 2, pp. 326-334,
Feb.
1999
10.3745/KIPSTE.1999.6.2.326
10.3745/KIPSTE.1999.6.2.326
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